combines high-resolution SEM imaging with analytical and dynamic experimental capabilities.

Technical Capabilities

• High performance SEM for nm or sub-nm resolution.
• Wide range of sample types, including insulators, beam sensitive or magnetic materials.>
• Excellent performance at long working distance (10 mm).
• Operating acceleration voltage from 20 V to 30 kV.
• Trinity detection system (in-lens and in-column) and ETD SE detectors.
• Retractable directional backscattered electron detector.
• Live quantitative EDS (2x 60 mm2 detector) with ColorSEM & EBSD detectors.
• Quick & easy sample loading and advanced automation.
• Beam deceleration (-4000 to +600 V) and low vacuum mode (10 – 800 Pa chamber pressure).
• Supports in-situ and in-operando stages (cryo mat, heating, tensile, 3- & 4-point bending, electrochemistry).

Please contact Kate Vanderburgh (kv434@drexel.edu) for more information and to arrange training.

provides high-resolution morphological and surface structural data.

Technical Capabilities

• High-resolution secondary imaging in high vacuum mode
• Operating acceleration voltage from 100v to 30Kv
• Five-axis stage
• Everhart-Thornley and Zeiss Gemini in-lens secondary electron detectors
• Dedicated backscattered electron detector
• Oxford UltiMax 40mm energy dispersive spectrometer for elemental analysis

Please contact Kate Vanderburgh (kv434@drexel.edu) for more information and to arrange training.

combines a high-resolution field emission scanning electron microscope with gallium focused ion column capable of ion milling material at the nanoscale.

Technical Capabilities

• High-resolution secondary electron imaging (3 nm resolution)
• Gallium ion milling
• Electron beam and ion beam deposition of Pt metal
• Energy dispersive spectroscopy and X-ray fluorescence for elemental analysis
• Omniprobe 200A for lift-out preparation of transmission electron microscope samples

Please contact Craig Johnson (clj46@drexel.edu) for more information and to arrange training

offers a robust platform for basic transmission electron imaging and diffraction experiments.

Technical Capabilities

• LaB6 thermionic electron source
• High-resolution objective lens (0.2 nm resolution)
• Electron diffraction
• Gatan Orius SC1000 CCD camera and DigitalMicrograph software
• Single tilt, double-tilt and high-tilt tomography holders available
• SerialEM tomography acquisition software

Please contact Craig Johnson (clj46@drexel.edu) for more information and to arrange training

combines high-resolution TEM imaging with scanning TEM (STEM) and analytical capabilities.

Technical Capabilities

• High-brightness Schottkey field-emission electron source
• High-resolution objective lens (0.2 nm resolution)
• Bright-field, annular dark-field and high-angle annular dark-field STEM imaging (0.2 nm resolution)
• Oxford XMax 80T silicon drift detector for elemental analysis and mapping
• Gatan Ultrascan CCD camera and DigitalMicrograph (GMS3) software
• Single tilt, double-tilt and high-tilt tomography holders available
• SerialEM tomography acquisition software

Please contact Craig Johnson (clj46@drexel.edu) for more information and to arrange training

provides high-quality, non-destructive 3D imaging of internal microstructures for a wide range of materials and working environments.

Technical Capabilities

• Dual-stage magnification based on synchrotron-caliber optics
• Submicron spatial resolution
• Large samples up to 25kg and 140mm by 165mm (width by height)
• High brightness 25W X-ray source with energies from 30kV to 160kV
• Multiple filters and detector configurations to maximize contrast
• Deben in situ 5kN tensile/compression stage with temperature control

Please contact Kate Vanderburgh (kv434@drexel.edu) for more information and to arrange training

provides a complete range of structural measurements including powder diffraction, thin film metrology including thin-film method, preferred orientation, crystal quality, reflectometry and grazing angle measurements.

Technical Capabilities

• 2.2 kW X-ray generator configured with long focus sealed Cu Kα X-ray tube
• Five axis goniometer circle with a range of -30° to 1600° 2θ
• Interchangeable cross-beam optics includes Bragg Brentano and Parallel Beam optics
• Ge220x2 and Ge 220x4 monochromator
• Anton Paar hot stage option for in situ heating up to 1100 °C
• SmartLab Guidance acquisition software, analytical software PDXL2 for qualitative and quantitative package with connected PDF2 database.

Please contact Dmitri Barbash (dvb36@drexel.edu) for more information and to arrange training

is a powerful, fast and flexible benchtop XRD system designed for high-throughput analysis of the variety of polycrystalline samples.

Technical Capabilities

• 600W X-ray Generator (40 kV and 15 mA)
• Highly reliable and rugged vertical goniometer with sample mounted in horizontal position. Goniometer Radius 150 mm minimizes intensity loss due to air scattering.
• Measuring range: -3° to ~ 145° 2θ. Scanning speed: 0.01° - 100° 2θ / min,
• Scintillation Counter Detector
• MiniFlex Guidance acquisition Software, PDXL 2 Quantitative and Quantitative Package with connected NIST and COD Crystal Structure databases.
• Standard sample stage for a wide range of standard sample holders
• Air-tight sample container

Please contact Dmitri Barbash (dvb36@drexel.edu) for more information and to arrange training

provides elemental and chemical composition of the first ten nm of a sample surface. VersaProbe system combines XPS measurements with additionally upgraded to UVPS, Hot/Cold stage, C60 ion gun source accessories.

Technical Capabilities

• Monochromatic Al K-Alpha (AlKα) souce of 1486.2 eV
• Ar+ and C60+ ion guns for depth profile measurements
• Dual-source neutralizer system for charge compensation
• 180° hemispherical analyzer has high angular acceptance for small area XPS sensitivity
• 16 channel MCD detector
• Ultraviolet photoelectron spectroscopy (UPS) for measuring work function and Fermi level
• Hot and cold stage for in-situ heating and cooling

Please contact Dmitri Barbash (dvb36@drexel.edu) for more information and to arrange training

allows deposition of thin metallic films.

Technical Capabilities

• 2 thermal stations for sequential vertical metal evaporation without breaking vacuum
• W metal boats for evaporation
• Al, Cr, Cu, Ni base metals – CRF supplied. Au, Pt, Ag precious metals – user supplied
• Water-cooled temperature monitor and Inficon quartz-crystal thickness monitor

Please contact Kate Vanderburgh (kv434@drexel.edu) for more information and to arrange training

allows precision Argon ion-beam thinning of TEM samples for electron transparency.

Technical Capabilities

• 0.5 to 5 kV focused argon ion beams
• Liquid nitrogen sample cooling
• Software user interface

Please contact Craig Johnson (clj46@drexel.edu) for more information and to arrange training

allows preparation of electron transparent sections of soft materials for transmission electron microscopy.

Technical Capabilities

• Room temperature and cryo (liquid N2) ultramicrotomy capable
• Microproccessor-controlled temperature, cutting speed and thickness advance
• Leica EM KMR2 glass knife maker

Please contact Kate Vanderburgh (kv434@drexel.edu) for more information and to arrange training

provides dynamic far-infrared response of samples upon photoexcitation with a femtosecond pulsed laser.

Technical Capabilities

• Home-built terahertz spectrometer with broadband 0.2 - 2 THz probe
• Tunable photoexcitation from 350 nm - 1.6 microns
• Sub-picosecond resolution and 3 nanosecond range
• Transmission or reflection geometry
• Enabled by Coherent Libra regeneratively amplified Ti:Sapphire laser

Please contact Jason Baxter (Professor of Chemical Engineering, jbaxter@drexel.edu) for more information and to arrange training.

provides dynamic UV/visible/Near-IR response of samples upon photoexcitation with a femtosecond pulsed laser. Technical Capabilities

Technical Capabilities

• CCD arrays for simultaneous detection of 350 - 800 nm or 800 - 1600 nm probe
• Tunable photoexcitation from 350 nm - 1.6 microns
• ~100-femtosecond resolution and 3 nanosecond range
• Transmission or reflection geometry
• Enabled by Coherent Libra regeneratively amplified Ti:Sapphire laser

Please contact Jason Baxter (Professor of Chemical Engineering, jbaxter@drexel.edu) for more information and to arrange training.