Surface Science Tools

Physical Electronics VersaProbe 5000 X-ray photoelectron spectrometer (XPS)

Provides elemental and chemical composition of the first ten nm of a sample surface. VersaProbe system combines XPS measurements with additionally upgraded to UVPS, Hot/Cold stage, C60 ion gun source accessories.

Technical Capabilities

• Monochromatic Al K-Alpha (AlKα) souce of 1486.2 eV
• Ar+ and C60+ ion guns for depth profile measurements
• Dual-source neutralizer system for charge compensation
• 180° hemispherical analyzer has high angular acceptance for small area XPS sensitivity
• 16 channel MCD detector
• Ultraviolet photoelectron spectroscopy (UPS) for measuring work function and Fermi level
• Hot and cold stage for in-situ heating and cooling

Please contact Dmitri Barbash for more information and to arrange training.