Electron Microscopy Tools
Thermo Fisher Apreo 2S Lo Vac scanning electron microscope (SEM)
Combines high-resolution SEM imaging with analytical and dynamic experimental capabilities.
Technical Capabilities
- High performance SEM for nm or sub-nm resolution.
- Wide range of sample types, including insulators, beam sensitive or magnetic materials.>
- Excellent performance at long working distance (10 mm).
- Operating acceleration voltage from 20 V to 30 kV.
- Trinity detection system (in-lens and in-column) and ETD SE detectors.
- Retractable directional backscattered electron detector.
- Live quantitative EDS (2x 60 mm2 detector) with ColorSEM & EBSD detectors.
- Quick & easy sample loading and advanced automation.
- Beam deceleration (-4000 to +600 V) and low vacuum mode (10 – 800 Pa chamber pressure).
- Supports in-situ and in-operando stages (cryo mat, heating, tensile, 3- & 4-point bending, electrochemistry).
Please contact Nicole Bohn for more information and to arrange training.
FEI Strata DB235 focused ion beam scanning electron microscope (FIBSEM)
Combines a high-resolution field emission scanning electron microscope with gallium focused ion column capable of ion milling material at the nanoscale.
Technical Capabilities
- High-resolution secondary electron imaging (3 nm resolution)
- Gallium ion milling
- Electron beam and ion beam deposition of Pt metal
- Energy dispersive spectroscopy and X-ray fluorescence for elemental analysis
- Omniprobe 200A for lift-out preparation of transmission electron microscope samples
Please contact Craig Johnson for more information and to arrange training.
JEOL 2100F field-emission transmission electron microscope (FTEM)
Combines high-resolution TEM imaging with scanning TEM (STEM) and analytical capabilities.
Technical Capabilities
- High-brightness Schottkey field-emission electron source
- High-resolution objective lens (0.2 nm resolution)
- Bright-field, annular dark-field and high-angle annular dark-field STEM imaging (0.2 nm resolution)
- Oxford XMax 80T silicon drift detector for elemental analysis and mapping
- Gatan Ultrascan CCD camera and DigitalMicrograph (GMS3) software
- Single tilt, double-tilt and high-tilt tomography holders available
- SerialEM tomography acquisition software
Please contact Craig Johnson for more information and to arrange training.
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