Training Library
- Zeiss Supra 50VP field-emission scanning electron microscope (SEM)
- FEI Strata DB235 focused ion beam scanning electron microscope (FIBSEM)
- JEOL 2100F field-emission transmission electron microscope (FTEM) [PDF]
- Rigaku SmartLab X-ray diffractometer (XRD)
- Rigaku Miniflex X-ray diffractometer (XRD) [PDF]
- Physical Electronics VersaProbe 5000 X-ray photoelectron spectrometer (XPS)
Training Video Gallery
Videos were filmed, edited, and produced by Natalie Fetzer (Drexel '22) and Michael Gaynor (Drexel '23).
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