Advances in In-Situ Microscopy: Addressing In-Situ TEM Challenges Using Integrated Hardware and Software

 

This intensive workshop sponsored by Gatan, JEOL, Oxford, and DENSsolutions at Drexel University will present and demonstrate state-of-the-art instruments and software for in-situ electron microscopy (EM) applications. Lectures and hands-on lab sessions will show how a complete in-situ system can optimize data management and reveal critical details in reactionprocesses. Specifically, temperature-induced transitions in both complex oxide materials and 2-dimensional MXene will be studied. Chemical and electronic transitions will be measured with direct detection electron energy loss spectroscopy (EELS), then correlated with the sample IV behavior. The in-situ system on a JEOL JEM 2100F STEM will feature: